The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

Mar. 10, 2000
Applicant:
Inventors:

Kauko Lehtinen, Raisio, FI;

Tom Javen, Kaarina, FI;

Vesa Sonne, Turku, FI;

Aarne Heinonen, Turku, FI;

Mika Routamaa, Lieto, FI;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/504 ;
U.S. Cl.
CPC ...
G01N 3/504 ;
Abstract

A sample handling method, in which the information on the sample to be examined is transferred throughout the entire measuring process by transferring the sample cup. The sample cups are handled in two independently operating drums, in which case at least two different handling phases can be carried out simultaneously in the measuring device. The diagnostic measuring device comprises a cassette drum, on the circumference of which the sample cup cassettes containing sample cups have been placed. The sample cup is fed to the first handling drum, which is simultaneously an incubation drum. After that the sample cup is transferred to a second handling drum, where washing, drying, measuring and discharge of the sample cup are carried out. The drums have been placed near each other, overlapping so that the transfers of the sample cup can be performed directly from one drum to another by means of transfer plungers.


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