The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Apr. 04, 2001
Applicant:
Inventor:

Ko Noguchi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A circuit design method for designing conductive members with a multilayered structure to have antenna sizes of proper values is disclosed. Individual damage is calculated for each of a plurality of antenna units of the conductive members with a multilayered structure, and an integrated circuit device is designed such that a total amount of the separately calculated individual damage is less than a predetermined permissible amount. It is possible to accurately calculate a total amount of damage to a gate insulating film even when the plurality of antenna units of the conductive members with a multilayered structure have different degrees of damage and antenna ratios from one another, and an integrated circuit device of optimal structure can be designed with high efficiency.


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