The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Jul. 05, 2000
Applicant:
Inventor:

Tony Wen Hsun Lai, Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

A method and computer program product for analyzing data retrieval using index scanning in a database management system. The method involves scanning an index associated with a table in the database management system and selecting pages in the index. For each of the selected pages, the index entries are extracted and ranked. A distance parameter is then determined for each of the ranked index entries. The number of page transfers is estimated based on the distance parameters and the number of consecutive index entries which can be stored in the buffer pool.


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Lai, Tony Wen Hsun. (2003). Method and apparatus for analyzing data retrieval using index scanning (U.S. Patent No. 6549895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6549895

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