The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Aug. 31, 1999
Applicant:
Inventors:

Chia-Chi Huang, Hsin-Shu, TW;

Yuh-Maiw Jong, Taoyuan, TW;

Jian-Hui Shen, Hsin-Chu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/300 ;
U.S. Cl.
CPC ...
G01R 2/300 ;
Abstract

A vector network analyzer using sliding correlator techniques and multi-user detection techniques. The sliding correlator technique is based on the time domain sliding effect caused by a small clock frequency offset in the pseudo random code generators of a transmitter and a receiver. A time scaled version of the impulse response of the device under test can be obtained from the time domain slided pseudo random code signals by using a correlator. A multi-user detection method is introduced using two uncorrelated pseudo random codes. One of the uncorrelated pseudo random codes measures the D.U.T. and another code is a reference channel. These codes can be demodulated and despread with one receiver module. A Fast Fourier Transform of the measured impulse response is the frequency response of the measured signal. By using multi-user techniques and calculating the frequency domain despreaded test signal and the frequency domain despreaded reference signal repeatedly, the test device frequency responses is obtained and disturbances of resulting signals caused by the receiver chaining characteristics and multi-user PN code effects are eliminated. The measurement time is also reduced as a single measurement generates output data for a wide frequency band instead of for a single frequency.


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