The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2003
Filed:
Sep. 04, 1997
Tatsuro Otaki, Tokyo, JP;
Kumiko Otaki, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
In the transmission illumination type differential interference microscope, light in a given polarized state is separated by a first birefringent optical member into two linearly polarized light components L and L and both of the polarized light components are converted into parallel light by means of a condenser lens . The object being examined is illuminated by the polarized light components which are then converted into convergent light by an objective . Both of the polarized light components are then synthesized into a single light beam by a second birefringent optical element and both of the polarized light components of the synthesized light beam are caused to undergo polarization interference by an analyzer so that an enlarged image of the object being examined , is formed. At least one of the first and second birefringent optical members and is formed by joining one isotropic prism or , consisting of an isotropic optical material, and one birefringent prism or , consisting of a birefringent optical material.