The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2003
Filed:
Sep. 15, 2000
David Alan Boas, Newmarket, NH (US);
Xuefeng Cheng, Malden, MA (US);
The General Hospital Corporation, Boston, MA (US);
Abstract
The invention features a calibration method for diffuse optical measurements that corrects transmittance measurements between a source and a detector for factors unrelated to sample properties. The calibration method is based on the same set of transmittance measurements that are subsequently corrected by the calibration and used in imaging and/or spectroscopy applications. The calibration method involves a forward calculation for each of multiple source-detector pairs based on an approximate model of the sample, and a minimization of an expression that depends on the forward calculations and the transmittance measurements to determine self-consistent coupling coefficients for every source-detector pair. Once the coupling coefficients have been determined, they can be used to correct the transmittance measurements. If desired, an inverse calculation can be performed on the corrected sample measurements to determine spatial variations in the optical properties of the sample. If necessary, the calibration can be repeated and iteratively improved, whereby the optical properties determined by the inverse calculation in an earlier iteration are used to improve the sample model for the forward calculation in a subsequent iteration.