The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2003
Filed:
Dec. 11, 2000
Arnold David Nielsen, Northville, MI (US);
Visteon Global Technologies, Inc., Dearborn, MI (US);
Abstract
A testing device generates electromagnetic noise such as transients, power interruptions and Radio Frequency Interference (RFI) for application to an electronic device to test the immunity of the electronic device to electromagnetic noise or to test the performance of the electronic device during exposure to electromagnetic noise. The testing device promotes an economical and efficient evaluation of Electromagnetic Compatibility (EMC) of an electronic device during product design or otherwise. The testing device includes a switch having electrical contacts for producing electromagnetic noise during a transition between a closed state and an open state of the electrical contacts and a trigger that is coupled to the switch. The trigger is arranged to change states between the closed state and the open state of the electrical contact. An input terminal is associated with the switch for applying electrical energy to the switch. An output terminal is associated with the switch for connection to the electronic device for testing operation of the electronic device in response to the electromagnetic noise.