The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Mar. 02, 2000
Applicant:
Inventors:

Yun Chur Chung, Taejun, KR;

Seung Kyun Shin, Taejun, KR;

Keun Joo Park, Mokpo, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/125 ;
U.S. Cl.
CPC ...
G01N 2/125 ;
Abstract

An apparatus monitoring frequency of WDM signals using pilot tone and two interleaved solid etalon filters for efficient management and maintenance of wavelength division multiplexing optical transmission network is provided. Desirably, the apparatus for optical frequency monitoring includes splitting means, a plurality of optical filtering means, optical detecting means, and frequency detecting means. The splitting means splits optical signal and the optical signal includes pilot tone. The plurality of optical filtering means filters an output of the splitting means with particular passband. The optical detecting means converts an output of the optical filtering means into electrical signal. The frequency detecting means detects an intensity of the pilot tone from an output of the optical detecting means and calculates optical frequency.


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