The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Apr. 20, 2001
Applicant:
Inventors:

Mohan Gurunathan, Santa Rosa, CA (US);

Zoltan D. Azary, Occidental, CA (US);

Greg C. Richtenburg, Sebastopol, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 4/014 ;
Abstract

A zero calibration system and method for an optical receiver include an illuminated photodetector, switchably coupled to an amplifier. The photodetector is de-coupled from the amplifier while illumination of the photodetector is maintained and an error signal is measured at the output of the amplifier The photodetector is then coupled to the amplifier and subsequent signals measured at the output of the amplifier are corrected according to the measured error signal, based on a comparison of the relative values of a feedback resistor, coupled between the output and an input of the amplifier, and an equivalent resistance of the photodetector. When the ratio of the feedback resistor to the equivalent resistance does not exceed a predetermined threshold, the subsequently measured signals at the output of the amplifier are corrected by offsetting the subsequently measured signals by the measured error signal. When the ratio exceeds the predetermined threshold, the subsequently measured signals at the output of the amplifier are corrected by offsetting the subsequently measured signals by the measured error signal as modified by a correction factor.


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