The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2003

Filed:

Jan. 19, 2001
Applicant:
Inventors:

Francesc Subirada, Barcelona, ES;

James A Mott, San Diego, CA (US);

Oscar Martinez, Barcelona, ES;

Assignee:

Hewlett-Packard Company, Fort Collins, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/9393 ; B41J 2/938 ;
U.S. Cl.
CPC ...
B41J 2/9393 ; B41J 2/938 ;
Abstract

A test pattern is scanned to find ideal print-medium advance for a pen (or other marking device). The pattern has a medium; and, marked on it, image patches each with overlapped swaths stepped by different distances. At best there are different-color pens; and for each distance a set of patches, each with a patch for each color (preferably area fills at sensitive tones by color). All patches in a set are best adjacent along a scan direction, with alignment lines above each set across the whole pattern, and a nozzle-conditioning patch at each image patch. A processor prints the pattern, operates a sensor and uses its signals to find optimum advance. The system finds and prints with ideal advance for a most-active pen; or weighs pen activity to find an optimum for all pens based on certain statistical and/or prospective choices.


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