The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Oct. 07, 1999
Robert Francis Berry, Austin, TX (US);
Jesse Mannes Gordon, Austin, TX (US);
Riaz Y. Hussain, Austin, TX (US);
Frank Eliot Levine, Austin, TX (US);
Robert J. Urquhart, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for compensating for trace overhead is provided by analyzing and compensating for the temporal overhead associated with generating or outputting trace information to a trace buffer or a trace file in the form of trace records. A trace record generally represents an occurrence of a profiling event of interest. The amount of time required to generate a trace record may be determined, and the trace times retrieved from the trace records are adjusted to compensate for the amount of time required to generate those trace records. A trace overhead calibration value may be determined by computing the average time necessary to generate a trace record, or in certain cases, by computing the minimum time necessary to generate a trace record. The trace overhead calibration value is stored for subsequent use in a profiling-related process in the data processing system.