The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2003

Filed:

Dec. 13, 1999
Applicant:
Inventors:

Frederic Hayem, San Diego, CA (US);

Patrick Arnould, Antibes, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

A method of operating on a net-list describing an integrated circuit design for use with an automated test pattern generator for testing an integrated circuit built using the design is described. The method includes replacing a defective portion of the design in test mode with a substitute circuit to reduce testing impact of the defective portion. The method includes identifying a first defective portion of the integrated circuit design in the net-list, determining conditions under which the first defective portion is likely to malfunction and replacing the first defective portion in the net-list with another first portion that provides unknown output signals representing an unknown state in response to conditions under which the first defective portion is likely to malfunction.


Find Patent Forward Citations

Hayem, Frederic. (2003). Integrated circuit analysis and design involving defective circuit element replacement on a netlist (U.S. Patent No. 6546514). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6546514

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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