The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2003

Filed:

Aug. 31, 1999
Applicant:
Inventors:

Joseph P. Coyle, Leominster, MA (US);

Garry M. Tobin, Atkinson, NH (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A test system for testing communications over a bus connecting electronic devices, e.g., components of a computer system is preferably embedded in the devices themselves rather than in apparatus external to them, and is responsive to digital control signals, e.g., conforming to JTAG, for scanning test data into and out of the devices. The test system has a stress injection module for injecting a set of stimulus patterns on the bus; an error identification module for identifying an error resulting from the set of stimulus patterns; a bus tuning module for adjusting one or more bus operating and signaling parameters so that testing can be performed at one or more of a number of different sets of operating and signaling parameters; a programmable control module for controlling the bus tuning module; and a presentation module for presenting a plurality of results of the testing.


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