The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Apr. 11, 2001
David Jahn, Cincinnati, OH (US);
Martin Marietta Materials, Inc., Raleigh, NC (US);
Abstract
A method and apparatus for performing multiple ratio analysis of aggregate particles, wherein the method includes the steps of measuring a first maximum dimension of a particle, measuring a second maximum dimension of a particle in a direction substantially perpendicular to the first maximum dimension, and inputting the first maximum dimension and second maximum dimension into a computer having a processor. Using the computer, a particle ratio of the first maximum dimension to the second maximum dimension for the measured particle is computed and the particle ratio is classified into one of a predetermined plurality of different ratio ranges, each of these plurality of different ratios representative of a different range of particle shapes. An apparatus for multiple ratio analysis includes a measurement device configured to measure a dimension of an aggregate particle along at least one axis at a time, a computer, and a program or instruction set permitting calculation of an aggregate particle ratio for the aggregate particle and classifying this aggregate particle ratio, as noted.