The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Oct. 17, 2000
Doris Hartmann, Gundelsheim, DE;
Sofiane Kacem, Nuremberg, DE;
Karl-Heinz Maier, Nuremberg, DE;
Klaus-Dieter Mueller, Nuremberg, DE;
Nicolai Plewinski, Roethenbach/Pegnitz, DE;
Thomas Voelkel, Bad Steben, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention is directed to a system and a method for the configuration and/or parameterization of diagnostic devices for test objects. The system includes a first data object having a collection of technological test object parameters of the test object and its components, and a second data object having a collection of technological parameters of hardware components of the diagnostic device. The system further includes a first program object containing data sentences for the assignment of at least test object parameters and technological parameters of hardware components, and a second program object for processing the data sentences assigned in the first program object. Via the data and program objects, a knowledge base is created that results in a configuration mainly automatically controlled by the knowledge of the system and/or parameterization of the diagnostic device including the test structure and evaluation. In this manner, the cost of such preparations is significantly reduced.