The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Jul. 29, 1999
Anthony P. Russo, New York, NY (US);
Veridicom, Inc., Sunnyvale, CA (US);
Abstract
A method for combining two templates. A first template having a first minutia set and a second template having a second minutia set are provided. The first template is compared with the second template to obtain a matching minutia set. Registration parameters are calculated from the matching minutia set. The registration parameters can be referenced to either the first minutia set or the second minutia set. All minutiae in the first or the second minutia set are translated to be on the same coordinate system as the other minutia set. The minutia sets are then combined to construct a combined minutia set. In one embodiment, an overlap region is drawn for the first template and the second template, the overlap region containing at least minutiae from the matching minutia set. The combined minutia set is constructed from the matching minutiae in the first or the second template, minutiae in the first minutia set that are not in the matching minutia set, and minutiae in the second minutia set that are not in the matching minutia set. In another embodiment, minutiae in the overlap region but not part of the matching minutia set are discarded.