The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
May. 16, 2001
Ralph W. Gerchberg, Ardsley, NY (US);
Other;
Abstract
A system and method for recovery of phase information from recorded intensity values is disclosed. In one aspect, a phase filter is placed in a plane, which may be the back focal plane (BFP) of a lens used for observing an object. The phase filter changes the phase of a wave front distribution in the BFP in a known manner. Amplitude stops or combinations of phase and amplitude filtering patterns can also be used to capture N different sets of intensity data in a conjugate diffraction plane. The N intensity images are used to obtain an estimate of the wave front at the first plane. This wave front estimate is then used to generate N modified estimates of the wave front at the conjugate plane, each modified estimate corresponding to one of N filtering patterns. In one implementation, the N modified IP estimates are corrected by replacing the estimated amplitudes with the actually measured ones for that image. The process is repeated iteratively until an error measure between the measured values and the synthetically generated ones falls below a known threshold. The resulting phase estimates can be used to display wave front information similar in appearance to holograms, or to create lens-free microscopes.