The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Apr. 24, 1998
Applicant:
Inventor:
John J. Lemasters, Chapel Hill, NC (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/602 ;
U.S. Cl.
CPC ...
G02B 2/602 ;
Abstract
Disclosed are devices to improve the z-axis of confocal microscopes. The devices consists of opaque baffles placed in front of and behind the detection apertures of the microscope systems. By converting the baffles and detection apertures into light sensitive surfaces in an axial array, images from multiple planes of focus can be collected simultaneously with improved z-axis resolution. Several configurations for baffles and axial arrays are also disclosed for use with micro scopes employing pinhole detection and slit detection.