The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2003

Filed:

Jul. 26, 2000
Applicant:
Inventors:

Jian-Yu Liu, Garland, TX (US);

Kuang-Yi Wu, Plano, TX (US);

Assignee:

Chorum Technologies LP, Richardson, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/402 ;
U.S. Cl.
CPC ...
H04J 1/402 ;
Abstract

A system for dealing with faults in wavelength division multiplexed (WDM) optical communications between two terminals connected by at least two optical fibers monitors the status of communications over both optical fibers. If both optical fibers are operating normally, a first set of channels is routed over the first optical fiber and a second set of channels (which is mutually exclusive of the first set of channels) is routed over the second optical fiber. However, if a fault is detected in either optical fiber, the first terminal combines the first and second sets of channels and routes the combined channels over the remaining optical fiber to the second terminal. The second terminal separates the combined channels to recreate the first and second sets of channels. Wavelength slicers can be used to multiplex and demultiplex the channels at both terminals. This architecture allows the first and second sets of channels to be interdigitally spaced.


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