The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Oct. 11, 2001
Applicant:
Inventors:
Barton F. Haynes, Durham, NC (US);
Gregory D. Sempowski, Durham, NC (US);
Hua-Xin Liao, Chapel Hill, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 7/334 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 7/334 ;
Abstract
The present invention relates, in general, to an assay system and, in particular, to a molecular assay system for the detection and/or quantification of mouse T cell receptor excision circles. The present system can be used to detect newly produced naïve T lymphocytes and to monitor thymic output and T lymphocyte immune reconstitution in mice.