The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Jul. 12, 1999
Noboru Oyama, Tokyo 180-0002, JP;
Tetsu Tatsuma, Tokyo, JP;
Yoshihito Watanabe, Tokyo, JP;
Osamu Hatozaki, Tokyo, JP;
Kaoru Kitakizaki, Saitama, JP;
Masanori Haba, Chiba, JP;
Takayuki Noguchi, Tokyo, JP;
Other;
Abstract
A QCM sensor including a sensor device, the sensor device having a crystal substrate, on both of front and rear surfaces of which a pair of electrodes are disposed so as to oppose with each other and the QCM sensor detecting and quantitatively analyzing components of a sample from either a variation in a fundamental resonant frequency or a variation in an impedance when a surface of one of the pair of electrodes is immersed into either a sample gas or a sample solution. The sensor device is arranged in a multi-channel structure such that four mutually opposing electrodes ( A through A, B through B) are disposed on both front and rear surfaces of the crystal substrate each electrode being arranged to enable a fixation of a receptor which is different for each component of a sample to be detected and quantitatively analyzed, whereby the QCM sensor detects and quantitatively analyzes once the components of one sample different for different electrodes.