The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Dec. 02, 1999
Swaroop Adusumilli, Aliso Viejo, CA (US);
Manoj Chandran, Tempe, AZ (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The present invention is a system and method that facilitates flexible restriction of output transmissions from chosen scan test cells and reduces adverse impacts on functional components from coincidental test vector values during scan test operations. The system and method of the present invention provides the capability of masking test vector values that coincidentally trigger certain undesirable events in functional components. In one embodiment, a system and method of the present invention masks test vector values shifted into scan test cells that are coupled to bus driver enabling signals. The system and method of the of the present invention also facilitates flexible selection of which scan test cell outputs are masked and permits a scan test cell to provide a scan test vector value to an associated functional component and prevent coincidental transmission of inappropriate test vector values.