The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jun. 16, 1998
Applicant:
Inventors:
Yakov Kamen, Cupertino, CA (US);
Joe Rickson, San Bruno, CA (US);
Leon Shirman, Redwood City, CA (US);
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/46 ;
U.S. Cl.
CPC ...
G06F 9/46 ;
Abstract
A mechanism for adaptive quality performance control in three-dimensional (3D) based personal computer applications is provided. The mechanism adaptively controls multiple application programming interface (API) modes by selecting the best possible mode automatically using an aggregation function of quality and performance while, at the same time, giving the user the opportunity to change the mode through interactive control.
Kamen, Yakov. (2003). Mechanism and apparatus for adaptive quality performance control in 3d based pc applications (U.S. Patent No. 6542938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6542938
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile