The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Sep. 29, 2000
Kyle T. Grucci, Nashua, NH (US);
Raman Vellayappan, Arlington, MA (US);
Arthur D. Frechette, Westford, MA (US);
Alan E. Frechette, Cambridge, MA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method of concurrently performing a component test with returning test result data in a distributed environment is disclosed. In general, in order to assure compatibility of the various components in an enterprise computing system, a service test is created as part of a compatibility test suite and passed to a test application server having a test application program. The test application program makes an initial connection to the component being tested that, in response, creates a connection to a logging listener. The logging listener spawns an acceptor corresponding to the component being tested. Once spawned, the component returns test data to its corresponding acceptor concurrently with the execution of the test.