The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jun. 08, 2001
Applicant:
Inventors:
Shigeru Saotome, Kaisei-machi, JP;
Kazuo Shimura, Kaisei-machi, JP;
Takeshi Ohkubo, Kaisei-machi, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract
A primary prospective abnormal shadow is detected in each of at least two radiation images of an object taken in different directions. Only primary prospective abnormal shadows which are detected in the respective radiation images and are in substantially the same position on the object is taken as a final prospective abnormal shadow.
Saotome, Shigeru. (2003). Method of and system for detecting prospective abnormal shadow and method of reproducing radiation image (U.S. Patent No. 6542771). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6542771
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile