The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2003

Filed:

Oct. 27, 2000
Applicant:
Inventors:

Yuichi Yamashita, Kawagoe, JP;

Atsushi Maki, Hachioji, JP;

Tsuyoshi Yamamoto, Hatoyama, JP;

Hideaki Koizumi, Tokyo, JP;

Fumio Kawaguchi, Hinode, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

In a system for performing imaging measurement of a test object by mounting many optical fibers to the test object, incident positions of the test object on which to illuminate light, detection positions of the test object from which to detect light and measurement positions which are determined from a positional relationship between the incident positions and the detection positions are displayed as graphic elements on a display unit. A state of detection signal level or a change in the state is displayed as a change in color or in pattern of the graphic element. Further, incident optical fibers for illuminating light to the test object and detection optical fibers for detecting light from the test object are mounted to the test object, and light emitting elements are mounted to probes to be mounted to the test object and interlocked with the change of the graphic elements.


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