The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
May. 03, 2001
Thomas K. Gaylord, Atlanta, GA (US);
Gregory D. VanWiggeren, Los Gatos, CA (US);
Donald D. Davis, Duluth, GA (US);
Elias N. Glytsis, Atlanta, GA (US);
Emmanuel Anemogiannis, Atlanta, GA (US);
Georgia Tech Research Corp., Atlanta, GA (US);
Abstract
An apparatus for measuring environmental parameters comprising an optical fiber-based sensor having thermally-induced diffraction gratings therein which are stable at very high temperatures for many hours. The diffraction gratings are, preferably, formed in an optical fiber by exposure to light from an infrared laser and do not degrade at high temperatures. A system for measuring an environmental parameter includes an optical fiber-based sensor, a light source, and a detector. According to a method of measuring an environmental parameter, the optical fiber-based sensor is positioned within a high-temperature environment having a parameter desired for measurement. The light source directs light into the optical fiber-based sensor. The detector measures the differential diffraction of the light output from the optical fiber-based sensor and determines a value of the environmental parameter based, at least in part, upon a known correlation between the differential diffraction and the environmental parameter.