The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
May. 16, 2001
Hermann Ries, Taunusstein, DE;
Patricia Schall, Darmstadt, DE;
Frank Cordes, Neustadt, DE;
Martin Hartick, Bad Nauheim, DE;
Heimann Systems GmbH, Wiesbaden, DE;
Abstract
A diffraction apparatus ( ) for determining crystalline and polycrystalline materials of an item in objects, preferably in luggage, having a collimation/detector arrangement ( ) and an X-ray source ( ) and which is mounted to be adjustable in an X-ray testing machine ( ). The collimation/detector arrangement ( ) is adjustable in height relative to the X-ray source ( ), and the two are also laterally and synchronously adjustable via respective adjustment elements ( ). The collimator ( ) has a conically-expanding round slot ( ), which simulates a predetermined angle (&THgr; ) of a scatter-beam path.