The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jun. 21, 2000
Bernd Michaelis, D-39175 Biederitz, DE;
Peter Albrecht, D-39104 Magdeburg, DE;
Other;
Abstract
A method of optically measuring a three-dimensional surface by sequentially projecting predetermined patterns onto the surface to generate thereon a predetermined number of temporary images of different intensities. Each of the images is recorded by sensors of at least two matrix cameras and grey values are determined in a pixel by pixel manner of those images. A first approximation value is determined for calculating a first measuring point on the surface, and coordinates of this approximation value are associated on the sensor surfaces of both camera. The grey values of the images of each camera at the positions of the projected points are determined by subpixel interpolation, and a pair of grey scale gradation is detected therefrom. These steps may be repeated until a measuring point is determined by a pair of grey scale gradations analyzed to be similar.