The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2003

Filed:

Mar. 03, 2000
Applicant:
Inventors:

Guenter Thorwirth, Laasdorf, DE;

Werner Reiland, Cospeda Stadt Jena, DE;

Assignee:

Jena-Optronik GmbH, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/159 ;
U.S. Cl.
CPC ...
G01N 2/159 ;
Abstract

An arrangement is disclosed for optically reading out the information from substrates having a multiplicity of individual samples, in particular for analyzing chemical and biological sample carriers. The arrangement presents a new possibility for optically reading out the information from matrix-type substrates having a multiplicity of individual samples which allows a fast read-out of a radiation which is influenced by the individual samples with a high degree of sensitivity. This possibility is achieved by the fact that, in the case of optically reading a matrix-type substrate having a multiplicity of metrically ordered pixels, the receiver that is provided is an individual receiver which has high sensitivity and a uniform receiver area, an electrooptical matrix and also an imaging optical system are present, each substrate pixel being assigned to a matrix pixel region by the imaging optical system, and the matrix can be driven in such a way that matrix regions which allow exclusively the feeding of radiation from a substrate pixel to the receiver can be switched separately. Radiation quantities from in each case at least one substrate pixel successively impinging on the receiver over a suitably chosen time interval. The result is that it is possible to evaluate a series of measured radiation quantities from selected sequences of substrate pixels at the output of the receiver.


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