The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jan. 19, 2001
Thomas Huth-Fehre, Altenberge, DE;
Frank Kowol, Münster, DE;
Abstract
The invention relates to a method for testing the functionality of a spectrometer for faults comprising at least one radiation source, one filter arrangement for separating the radiation into different wavelength ranges, and one receiving arrangement. The invention also relates to a spectrometer comprising a fault recognition device. Reference values are generated at at least two different color temperatures of the radiation source and in the different wavelength ranges. Actual received signals at at least two color temperatures to be set are compared with the reference values in order to test the spectrometer. In the occurrence of variations, the type of variation is determined according to the wavelength ranges and the color temperatures, and definite faults are concluded from the type of variation.