The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2003

Filed:

Jun. 04, 2001
Applicant:
Inventor:

Mark P. Wernet, Sheffield Village, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/36 ;
U.S. Cl.
CPC ...
G01P 3/36 ;
Abstract

A planar velocity measurement system ( ) is operative to measure all three velocity components of a flowing fluid ( ) across an illuminated plane ( ) using only a single line of sight. The fluid flow is seeded with small particles which accurately follow the flow field fluctuations. The seeded flow field is illuminated with pulsed laser light source ( ) and the positions of the particles in the flow are recorded on CCD cameras ( ). The in-plane velocities are measured by determining the in-plane particle displacements. The out-of-plane velocity component is determined by measuring the Doppler shift of the light scattered by the particles. Both gas and liquid velocities can be measured, as well as two-phase flows.


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