The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Oct. 15, 1999
Applicant:
Inventor:
Rintaro Nakatani, Chiba, JP;
Assignee:
Seiko Instruments Inc., , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 2/100 ;
U.S. Cl.
CPC ...
G08B 2/100 ;
Abstract
A thermal analyzer comprising a measurement module ( ) having a heating furnace ( ), a measurement station ( ) which controls the measurement module ( ) and has a measurement user interface, a monitor ( ) and software operating on respective central processing units ( and ). An inquiry made about the existence of data and transfer of user-designated data to the measurement stat ion ( ) in which measurement data are stored from the monitor station ( ) permits us to monitor the data at the monitor station ( ).