The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
May. 07, 2001
Kazuaki Masuda, Kanagawa, JP;
NEC Corporation, Tokyo, JP;
Abstract
A semiconductor device and a method for testing the semiconductor device of the present invention includes n macro blocks which process input data supplied from input terminals and output the data from output terminals, a test circuit which supplies test data for testing the macro blocks and receives the test data processed by the macro blocks in the test mode and a test path which supplies the test data from the test circuit to the input terminal of the macro block, supplies data of the output terminal of the k-th (k=1 to (n−1)) macro block to the input terminal of the macro block to the test circuit in the test mode. One macro block can be selected randomly to be tested.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile