The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jun. 27, 2001
Kenji Kobuchi, Kawasaki, JP;
Ryouji Takano, Kawasaki, JP;
Yutaka Matsukuma, Kawasaki, JP;
Toru Hirose, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
An electromagnetic wave measurement system includes an electromagnetic wave emitting unit, measurement condition changing unit for changing a measurement condition, a control unit controlling the electromagnetic wave emitting unit and the measurement condition changing unit based on actual measurement data of the object electronic circuit, which data has previously been measured under a predetermined measurement condition, and measurement condition data of the predetermined measurement condition in such a manner that electromagnetic waves resembling those of the object electronic circuit is emitted from the electromagnetic wave emitting unit under the same condition as the predetermined measurement condition. With this system, since the electromagnetic wave emitting unit emits electromagnetic waves exactly resembling those of electronic circuits constitute an electronic device, it is possible to perform the electromagnetic wave measurement as if all the electronic circuits are collected even when all the electronic circuits are not collected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile