The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Apr. 10, 2001
Applicant:
Inventors:
Harvey C. Allard, Jr., Burlington, VT (US);
Donald J. Cook, Essex Junction, VT (US);
Robert J. Gauthier, Jr., Hinesburg, VT (US);
Edward S. Hoyt, South Burlington, VT (US);
Dain E. Reinhart, Fairfax, VT (US);
John A. Watson, late of Burlington, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/912 ; G01R 3/102 ; H02H 9/02 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01R 2/912 ; G01R 3/102 ; H02H 9/02 ; G06F 1/900 ;
Abstract
A method and apparatus for automated testing of a plurality of electrostatic discharge (ESD) devices on a wafer. The wafer has M padsets and N conductive pads on each padset, where m is at least 1, and n is at least 2, and each ESD device is conductively coupled to a unique plurality of pads of a padset of the M padsets. Testing sequences, under program control of a computer system, implement the testing of the ESD devices.