The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6541754 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 01, 2003

Filed:

Jun. 29, 2001
Applicant:
Inventor:

Jinsho Matsuyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/512 ; H01L 3/100 ;
U.S. Cl.
CPC ...
G06F 1/512 ; H01L 3/100 ;
Abstract

To provide a measuring method capable of measuring even a large-area stacked photoelectric conversion device such as a module or array either indoors or outdoors and accurately measuring the photoelectric conversion characteristics using an inexpensive measuring system, the photoelectric conversion characteristics of a photoelectric conversion device under irradiation light in a plurality of spectral states and a shift of the short-circuit current of each component cell of the photoelectric conversion device from the standard test condition are estimated, and the measured photoelectric conversion characteristics and the estimated shift are compared, thereby obtaining the photoelectric conversion characteristics of the photoelectric conversion device in the standard test conditions.


Find Patent Forward Citations

Matsuyama, Jinsho. (2003). Method and apparatus for measuring photoelectric conversion characteristics of photoelectric conversion device (U.S. Patent No. 6541754). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6541754

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