The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Feb. 10, 2000
Takayuki Asahina, Shizuoka, JP;
Sony Disc Technology Inc., Tokyo, JP;
Abstract
An optical disk checkup/measuring apparatus capable of shortening measuring time and of being incorporated into a manufacturing line and has a simple structure includes rotation driving elements ( ) for driving rotation of an optical disk to be measured ( ), a light emitting portion LD for emitting a light beam LF onto the optical disk to be measured ( ), an optically detecting portion (D , D ) for receiving and detecting the light beam LR reflected from the optical disk to be measured ( ) and an operation processing portion ( ) for processing a signal received and detected by the optically detecting portion (D , D ) so as to form a specified signal. The light emitting portion is composed of a plurality of light emitting elements LD provided in a radial direction of the optical disk to be measured ( ), and the light beams are emitted successively from the light emitting elements LD onto the optical disk to be measured ( ).