The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Apr. 06, 2000
Walter W. Weiss, West Hempstead, NY (US);
John L. Sullivan, Ft. Salonga, NY (US);
Jeffrey J. Bott, Setauket, NY (US);
Jacek A. Eubig, Floral Park, NY (US);
Testing Machines, Inc., Islandia, NY (US);
Abstract
A test apparatus is provided for measuring loads applied to an object and for measuring the deformation of the object in response to the loads. The test apparatus includes a stationary work head and a movable arm. The movable arm is selectively movable toward or away from the stationary work head. A load cell has a driven end mounted to the movable arm and a sensing end spaced from the movable arm. A movable work head is mounted to the sensing end and is configured for applying a load to a test object positioned between the stationary and movable work heads. A liner scale also is mounted to the sensing end of the load cell, and a linear encoder or read head is mounted in spaced relationship to the linear scale. The encoder reads deflection in the apparatus in view of loads applied during a test. A controller is provided for moving the movable work head in accordance with test parameters. The controller also receives output from the load cell and the read head, and uses that outputted information to develop stress-strain analytical data.