The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
May. 18, 2000
Wilfried Dähn, Celle, DE;
Infineon Technologies AG, Munich, DE;
Abstract
In order to test a semiconductor memory, a bit fail map is generated in that a predetermined data value is written to memory cells and subsequently read out and compared with the data value that has been written. The bit fail map is buffer-stored on the semiconductor memory in a memory bank other than the one that is currently being tested. Reliability of the test method is improved since defects in different memory banks can be regarded as independent of one another. It is advantageous for the bit fail map to be stored three times in different memory banks and for a majority decision to be taken during read-out.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile