The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Nov. 23, 1999
Shawn Kenneth Walker, Fort Collins, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
Disclosed is a device and method for testing of a program or a design of an electronic device comprising digital logic circuitry. The method comprises testing the design of software or an electronic device and injecting, after initiation of the testing step, a predetermined error pattern into a value operated upon by the design of the digital logic circuitry. In a preferred embodiment, the software is a simulation of the design of a processor having a cache with error detection and/or correction circuitry. A triggering condition is preferably a cache hit, in response to which a detectable error is injected into the cache. The simulated operations of the model are observed to determine whether the injected error is detected, as should happen if the processor's error detection circuitry has been designed properly. In another respect, the invention is an apparatus, or computer software embedded on a computer readable medium, for testing a program comprising an error detector. The apparatus or software comprises the program, an error injector module connected to the program; and a checker module connected to the program. The checker module is capable of determining whether the program responds appropriately to an error dynamically produced by the error injector module during execution of the program. By injecting errors dynamically the invention easily facilitates precisely focused testing at any time during simulated operation regardless of initialization conditions.