The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Feb. 03, 2000
Feng Zhao, Campbell, CA (US);
Eric-J. Manders, Nashville, TN (US);
Xerox Corporation, Stamford, CT (US);
Abstract
The present invention discloses methods for condition-based monitoring of a system and its components using joint time-frequency analysis and signal demodulation. A first method allows construction of models of non-stationary signals having multiple time and frequency scales of interest. In particular, the method uses wavelet analysis to encode essential information in time-frequency transformations and provides a signal model for an operating fault or normal operation of a system of interest. A second method uses the signal models for condition-based monitoring to detect a change in a signal. In this method, the signal models are correlated with sensor signals to determine the operating condition of a system or system component. A third method for condition-based monitoring uses signal demodulation. In this method, a nominal response of a system component is subtracted from a detected signal to more reliably detect subtle changes in the signal due to component degradation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile