The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2003

Filed:

Nov. 06, 2000
Applicant:
Inventors:

Weimin Li, Tracy, CA (US);

Sajid Hussain, Santa Clara, CA (US);

Andrew Nakao, Fremont, CA (US);

Vikas Khandelwal, Santa Clara, CA (US);

Assignee:

3Com Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 ;
U.S. Cl.
CPC ...
G06F 3/00 ;
Abstract

Log entries in a system that produces status or other log data (ASIC verification system, for example) are saved in a circular buffer until a trigger event occurs. Typically, the system operates on a Device Under Test (DUT), but may apply to other systems that simply monitor or gather information. When the trigger occurs, a window of the saved log entries are saved to disk. A level of granularity of the reporting for the log entries is set at any point between low level (cycle based) reporting (recording every event) to high level functional descriptions of the processes or activities performed by the system, DUT, or other item being monitored. Log data from various modules of the system are grouped together to provide a logical view of the recorded log entries.


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