The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6539330 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 25, 2003

Filed:

Jul. 13, 2001
Applicant:
Inventor:

Shigeru Wakashiro, Tokyo, JP;

Assignee:

PENTAX Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 1/100 ;
U.S. Cl.
CPC ...
G01C 1/100 ;
Abstract

An apparatus for measuring three-dimension information of an object has an image reader, a corresponding point detector and a three-dimension information calculator. The image reader reads a pair of images recorded in a recording medium in the apparatus. Note that, the object is cylindrical and a pair of occluding contours is reflected in each of the pair of images. The corresponding point detector detects at least one pair of corresponding points, which is an imaginary pair of images of at least one measuring point positioned on a central axis, on a pair of bisecting lines. The three-dimension information calculator calculates the three-dimension position of the at least one measuring point on the basis of the at least one pair of corresponding points by applying a triangulation method.


Find Patent Forward Citations

Wakashiro, Shigeru. (2003). Method and apparatus for measuring 3-d information (U.S. Patent No. 6539330). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6539330

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…