The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Aug. 11, 2000
Wilfried Hartmann, Halle/Saale, DE;
Arno Simon, Karlsruhe, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
The invention concerns a method and a device for process control of reaction processes using Fourier transform infrared spectroscopy. In accordance with the invention, an interferogram is generated before or after interaction with the compositions. Subsequent thereto, the interferogram is inspected in segments for externally introduced intensity fluctuations. The intensity fluctuations are subjected to an analysis procedure involving integration, differentiation, or the like, and on the basis of this evaluation, a decision is made as to whether or not the interferogram has an acceptable degree of interfering signals. The interferogram is labeled with this evaluation result and the procedure is repeated a plurality of times. After a sufficient number of acceptable interferograms have been collected, the acceptable interferograms are summed and subjected to a Fourier transform process to extract the frequency dependence. In this manner, Fourier transformation infrared spectroscopy techniques can be applied for process control of processes which would otherwise be impossible due to unacceptably large degrees of interference caused primarily by bubble formation.