The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2003

Filed:

Oct. 22, 1999
Applicant:
Inventors:

Michael Rauth, Traunreut, DE;

Johann Zacek, Evenhausen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A method for reducing computational expenditure required to compensate for temperature-related dimensional deviations in a machine tool is described. Temperature-related dimensional deviations are compensated for before the user input information existing in the workpiece-specific coordinate system is converted into the machine-specific coordinate system. As a result, the requisite coordinate transformation carried out with the aid of a mapping matrix does not have to be performed twice, once for user input information and again for compensation values. In addition, the compensation values for the temperature-dependent expansion are only calculated when a minimum value for the temperature variation is exceeded.


Find Patent Forward Citations

Rauth, Michael. (2003). Method for compensating for temperature-related dimensional deviations in machine geometry (U.S. Patent No. 6539274). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6539274

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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