The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Sep. 20, 2000
Hiromi Kimura-Suda, Tokyo, JP;
Takafumi Sassa, Tokyo, JP;
Tatsuo Wada, Wako, JP;
Hiroyuki Sasabe, Musashino, JP;
Other;
Abstract
According to the present invention, it is adapted to calculate simultaneously an absolute molecular orientation with an effective second order nonlinear optical constant in an object to be measured without changing a measuring point. Further, in order that a period of time required for measuring an absolute molecular orientation and an effective second order nonlinear optical constant in an object to be measured is reduced, whereby a possibility of damaging the object to be measured can be minimized, measurement is carried out by the use of a single light source in accordance with SHG phase method without shifting the measuring point of the; object to be measured, so that the absolute molecular orientation and the effective second order nonlinear optical constant can be calculated from a fitting curve achieved as a result of fitting the fringe obtained by the above described measurement.