The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Jan. 22, 2001
Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);
Daniel Robert Olson, Voorheesville, NY (US);
Michael Jarlath Brennan, Burnt Hills, NY (US);
James Norman Cawse, Pittsfield, MA (US);
Bret Ja Chisholm, Clifton Park, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
The present invention provides a method for quantifying structural defects of a coating composition on a given substrate, where certain structural defect-inducing tests are performed. In this method, a coating formulation is doped with a colorimetric or luminescent material. Concentration of the material depends on the quantum efficiency, excitation and emission wavelengths, and employed detection techniques, and can range from about 1 fM to about 1 mM. Before, during and/or after such tests, the coating is illuminated with a wavelength of radiation at which the reflected or transmitted color or emitted luminescence of the material in the coating is detectable with an optical detector or by visual inspection. In this fashion, the percentage of failure of the coating can be quantified as well as the level of interdiffusion of coating into substrate or substrate into coating. The method of the invention is thus particularly well-suited for the combinatorial analysis of an array of coating samples. Additionally, when the structural defect-inducing material test is being performed, the removed coating material can be analyzed in like fashion.