The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2003

Filed:

Jul. 05, 2002
Applicant:
Inventors:

Timothy J. McManus, Minneapolis, MN (US);

Shane M. Anderson, Brooklyn Park, MN (US);

Assignee:

Infrared Solutions, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/500 ;
U.S. Cl.
CPC ...
H01L 2/500 ;
Abstract

A method and apparatus for controlling bias for an microbolometer focal plane array which includes use of one thermally-shorted microbolometer detector thermally shorted to the substrate upon which one or more thermally-isolated microbolometers are constructed. A calibration bias source magnitude is determined and continually adjusted as a function of (i) the temperature related reading value of the resistance of the thermally-shorted microbolometer at calibration, and (ii) the temperature related reading value of the resistance of the thermally-shorted microbolometer after each image sample is taken.


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