The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Dec. 13, 2000
Hoa Do, Fremont, CA (US);
Yoshihiro Ikeda, San Jose, CA (US);
Yoshiaki Sonobe, San Jose, CA (US);
Kentaro Takano, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A perpendicular magnetic recording disk has an underlayer structure that causes the magnetic layer to have perpendicular magnetic anisotropy and high signal-to-noise ratio (SNR). The underlayer structure comprises a B2 type body-centered-cubic (BCC) material, such as the binary alloys NiAl, RuAl and RuTi, as an underlayer, and a Ti or TiCr alloy sublayer formed directly on the underlayer. The magnetic layer, such as a CoCrPt alloy, is deposited directly on the sublayer. The magnetic layer has perpendicular magnetic anisotropy due to the sublayer yet excellent SNR because of the smaller grain size of the sublayer material formed directly on the B2 type underlayer.